Semiconductor Power Devices: Physics, Characteristics, Reliability by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker

Semiconductor Power Devices: Physics, Characteristics, Reliability



Download Semiconductor Power Devices: Physics, Characteristics, Reliability




Semiconductor Power Devices: Physics, Characteristics, Reliability Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker
Language: English
Page: 550
Format: pdf
ISBN: 3642111246, 9783642111242
Publisher:

Review

Aus den Rezensionen: “... Das Buch ist eine erweiterte, aktualisierte englische Version des deutschen Buchs der Autoren. Es präsentiert Leistungshalbleiter auf umfassender Weise ... Das Buch prasentiert auch diverse Störungen und Schwingungen, die durch Schaltvorgänge bei Leistungskomponenten verursacht werden. ... Die Lektüre schafft es, fundierte Theorie praxisnah und verständlich zu vermitteln. Ein gründliches, ausgewogenes Buch, das sowohl Energietechnik-Studierenden als auch Leistungselektronik-Entwicklungsingenieuren eine Fülle an wertvollen Informationen und Einsichten bietet.“ (in: Bulletin SEV/VSE, 7/October/2011, Issue 10, S. 68)

From the Back Cover

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

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